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COMPOSITION AND METHOD FOR ENHANCING POT LIFE OF HYDROGEN PEROXIDE-CONTAINING CMP SLURRIES

机译:增强含过氧化氢的CMP浆料的罐寿命的组合物和方法

摘要

A composition suitable for copper chemical-mechanical polishing (CMP) comprises an abrasive powder, such as a silica and/or alumina abrasive, in a liquid carrier. The composition has a transition metal content of less than about 5 parts per million (ppm), preferably less than about 2 ppm. Preferably the composition contains less than about 2 ppm of yttrium, zirconium, and/or iron. The CMP compositions, when combined with hydrogen peroxide, provide CMP slurries for copper CMP that have improved pot life by ameliorating hydrogen peroxide degradation in slurries.
机译:适用于铜化学机械抛光(CMP)的组合物在液体载体中包含磨料粉末,例如二氧化硅和/或氧化铝磨料。该组合物的过渡金属含量小于约百万分之5(ppm),优选小于约2ppm。优选地,组合物包含小于约2ppm的钇,锆和/或铁。当CMP组合物与过氧化氢组合时,通过改善浆料中的过氧化氢降解,提供了用于铜CMP的CMP浆料,其具有改善的适用期。

著录项

  • 公开/公告号IL190426A

    专利类型

  • 公开/公告日2012-12-31

    原文格式PDF

  • 申请/专利权人 CABOT MICROELECTRONICS CORPORATION;

    申请/专利号IL20080190426

  • 发明设计人

    申请日2008-03-25

  • 分类号C23Fnull/null;

  • 国家 IL

  • 入库时间 2022-08-21 16:41:36

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