首页> 外国专利> CHEMICAL VAPOR DEPOSITION OF HIGH QUALITY FLOW-LIKE SILICON DIOXIDE USING A SILICON CONTAINING PRECURSOR AND ATOMIC OXYGEN

CHEMICAL VAPOR DEPOSITION OF HIGH QUALITY FLOW-LIKE SILICON DIOXIDE USING A SILICON CONTAINING PRECURSOR AND ATOMIC OXYGEN

机译:含硅前驱体和原子氧的高品质流态二氧化硅化学气相沉积

摘要

The method of depositing a silicon oxide layer on a substrate is disclosed. The method may include the step of injecting the atomic oxygen precursor includes providing a substrate in a deposition chamber, generating the atomic oxygen precursor outside the deposition chamber, and the chamber. In addition, the methods may include a step of injecting a silicon precursor to the deposition chamber, the silicon precursor and the atomic oxygen precursor are mixed in the first chamber. The silicon precursor and the atomic oxygen precursor reacts to form a silicon oxide layer on the substrate, depositing a silicon oxide layer may be annealed. In addition, systems are also disclosed for depositing a silicon oxide layer on the substrate.
机译:公开了在衬底上沉积氧化硅层的方法。该方法可以包括注入原子氧前驱物的步骤,该步骤包括在沉积室中提供衬底,在沉积室和该室的外部产生原子氧前驱物。另外,该方法可以包括将硅前驱物注入到沉积室中的步骤,在第一室中混合硅前驱物和原子氧前驱物。硅前驱体和原子氧前驱体反应以在基板上形成氧化硅层,可以退火沉积氧化硅层。另外,还公开了用于在衬底上沉积氧化硅层的系统。

著录项

  • 公开/公告号KR101215033B1

    专利类型

  • 公开/公告日2012-12-24

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20077020861

  • 申请日2007-05-30

  • 分类号C23C16/40;C23C16/50;H01L21/205;

  • 国家 KR

  • 入库时间 2022-08-21 16:28:01

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