首页> 外国专利> HIGH EFFICIENCY SEMICONDUCTOR PHOTO DEVICE STRUCTURE HAVING ELECTRON TUNNELING BARRIER LAYER AND MANUFACTURING METHOD THEREOF

HIGH EFFICIENCY SEMICONDUCTOR PHOTO DEVICE STRUCTURE HAVING ELECTRON TUNNELING BARRIER LAYER AND MANUFACTURING METHOD THEREOF

机译:具有电子隧穿势垒层的高效半导体光电器件结构及其制造方法

摘要

PURPOSE: A high efficiency semiconductor photo device structure having an electron tunneling barrier layer and a manufacturing method thereof are provided to improve optical extraction efficiency by inserting an electron tunneling barrier between a N-type GaN layer and a multi quantum well. CONSTITUTION: An electron tunneling barrier layer(232) is formed on an N-type nitride semiconductor layer(AlxInyGa1-x-yNs (0x1, 0y1, 0x+y1)). A multiple quantum well(233) is formed on the ETB layer as an active layer. A P-type nitride semiconductor layer(235) is formed on the multiple quantum well. The electron tunneling barrier layer improves the recombination of holes which are injected from a P-type nitride semiconductor layer into the multiple quantum well. [Reference numerals] (210) Substrate; (220) Template layer; (230) LED layer; (234) Removable
机译:目的:提供一种具有电子隧穿势垒层的高效半导体光电器件结构及其制造方法,以通过在N型GaN层和多量子阱之间插入电子隧穿势垒来提高光提取效率。组成:电子隧穿势垒层(232)形成在N型氮化物半导体层(AlxInyGa1-x-yNs(0x1,0y1,0x + y1))上。在ETB层上形成多量子阱(233)作为有源层。在多量子阱上形成P型氮化物半导体层(235)。电子隧穿势垒层改善了从P型氮化物半导体层注入到多量子阱中的空穴的复合。 [附图标记](210)基板; (220)模板层; (230)LED层; (234)可移动

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