首页> 外国专利> DIGITAL HOLOGRAPHIC MICROSCOPE FOR 3 DIMENTIONAL DEFECT INSPECTION OF DISPLAY SUBSTRATE AND INSPECTION METHOD USING THE SAME

DIGITAL HOLOGRAPHIC MICROSCOPE FOR 3 DIMENTIONAL DEFECT INSPECTION OF DISPLAY SUBSTRATE AND INSPECTION METHOD USING THE SAME

机译:用于显示基体的三维缺陷检测的数字全息显微镜和使用相同方法的检测方法

摘要

PURPOSE: digital holographic microscope and defect detecting method use the distance of the identical display base plate defect for providing the defect display base plate for arriving hologram and without hesitation measuring maximum height to be existed according to the regenerating phase reconstruction image in inversion of phases. ;CONSTITUTION: digital holographic microscope includes a light source (100), a reference light generator (200), in object light generator (300), CCD (charge-coupled device) (400), operating unit (500). Reference light CCD records a hologram by combining reference light and object light. Numerically Analysis interference fringe records operating unit. Operating unit obtains the image of multiple phase reconstructions, and with scheduled regeneration, apart from section, the distance from minimum to maximum regeneration regenerates CCD of the distance relative to hologram record; Continuously regenerate the minimum regeneration distance from phase reconstruction; And the distance of the display base plate defect of maximum height is determined, according to the regenerating phase reconstruction image, exist in inversion of phases. ;The 2013 of copyright KIPO submissions
机译:用途:数字全息显微镜和缺陷检测方法利用同一显示基板缺陷的距离来提供缺陷显示基板以用于到达全息图,并且毫不犹豫地根据相变中的再生相重建图像来确定存在的最大高度。组成:数字全息显微镜包括光源(100),参考光发生器(200),物体光发生器(300),CCD(电荷耦合器件)(400),操作单元(500)。参考光CCD通过组合参考光和物体光来记录全息图。数值分析干涉条纹记录操作单元。运算单元获得多相重建的图像,并按计划进行再生,除了截面以外,从最小再生到最大再生的距离将再生相对于全息图记录的CCD距离;从相位重建连续再生最小再生距离;并根据再生的相位重建图像确定最大高度的显示基板缺陷的距离,该相位反转存在。 ; 2013年版权KIPO提交文件

著录项

  • 公开/公告号KR20130042191A

    专利类型

  • 公开/公告日2013-04-26

    原文格式PDF

  • 申请/专利权人 MYTHOS;

    申请/专利号KR20110106354

  • 发明设计人 EOM HYO SOON;YU YOUNG HUN;HWANG JAE HAK;

    申请日2011-10-18

  • 分类号G01B9/04;G01B11/24;G01N21/88;

  • 国家 KR

  • 入库时间 2022-08-21 16:27:17

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号