首页> 外国专利> WAFER AND A METHOD FOR FABRICATION THE WAFER CAPABLE OF ACCURATELY CONTROLLING GROWTH SPEED BY ADJUSTING PROCESS PRESSURE

WAFER AND A METHOD FOR FABRICATION THE WAFER CAPABLE OF ACCURATELY CONTROLLING GROWTH SPEED BY ADJUSTING PROCESS PRESSURE

机译:晶圆和一种通过调整过程压力来精确控制生长速度的晶圆的方法

摘要

PURPOSE: A wafer and a method for fabrication the wafer are provided to improve the performance of an epi layer by relieving the stress of the epi layer.;CONSTITUTION: A step for growing an epi layer is processed under growth pressure(PG). The step for growing the epi layer includes a step of growing a buffer layer for controlling defects existing in a wafer surface. The buffer layer for controlling defects is processed at the beginning of the step for growing the epi layer. The step for growing the epi layer includes a step(s1) for maintaining a first pressure(P1) and a step(s2) for maintaining a second pressure(P2). The first pressure is 3 to 10 % higher than the growth pressure.;COPYRIGHT KIPO 2013;[Reference numerals] (AA) Pressure; (BB) Time
机译:目的:提供一种晶片和一种制造晶片的方法,以通过减轻外延层的应力来改善外延层的性能。组成:在生长压力(PG)下加工用于生长外延层的步骤。生长外延层的步骤包括生长用于控制晶片表面中存在的缺陷的缓冲层的步骤。在生长外延层的步骤开始时,处理用于控制缺陷的缓冲层。生长外延层的步骤包括用于维持第一压力(P1)的步骤(s1)和用于维持第二压力(P2)的步骤(s2)。第一压力比增长压力高3至10%。; COPYRIGHT KIPO 2013; [参考数字](AA)压力; (BB)时间

著录项

  • 公开/公告号KR20130045493A

    专利类型

  • 公开/公告日2013-05-06

    原文格式PDF

  • 申请/专利权人 LG INNOTEK CO. LTD.;

    申请/专利号KR20110109731

  • 发明设计人 KIM MOO SEONG;

    申请日2011-10-26

  • 分类号H01L21/20;

  • 国家 KR

  • 入库时间 2022-08-21 16:27:14

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