首页> 外国专利> EMBEDDED TOROID FOR MEASURING FLOWING CURRENT IN A THROUGH SILICON VIA WHICH IS FORMED ON A SILICONE INTERPOSER AND A MANUFACTURING METHOD THEREOF AND SILICONE INTERPOSER

EMBEDDED TOROID FOR MEASURING FLOWING CURRENT IN A THROUGH SILICON VIA WHICH IS FORMED ON A SILICONE INTERPOSER AND A MANUFACTURING METHOD THEREOF AND SILICONE INTERPOSER

机译:硅酮用于测量硅通孔中的流动电流,硅通孔由硅中介层组成,其制造方法和硅中介层

摘要

PURPOSE: An embedded toroid and a manufacturing method thereof and silicone interposer are provided to precisely measure flowing current by directly measuring an actual circumference of a through silicon via by surrounding thereof inside the silicone interposer.;CONSTITUTION: Nearing through silicon vias (NTSV1~NTSV7) are arranged close to the circumference of a through silicon via. Far through silicon vias (FTSV1~FTSV7) are arranged close to the circumference of a through silicon via. Nearing through vias and far through silicon vias are serially connected to the upper wiring pattern (TWP1~TWP7) and bottom wiring pattern (BWP1~BWP6). A test socket (PORT1) is connected to the upper end of the through silicone via. A test socket (PORT2) is connected to the far through silicone via.;COPYRIGHT KIPO 2013
机译:目的:提供一种嵌入式环形线圈及其制造方法和有机硅中介层,以通过直接测量硅通孔内部的直通硅通孔的实际周长来精确地测量流动电流;组成:硅通孔附近(NTSV1〜NTSV7) )的位置靠近硅通孔的周围。硅通孔(FTSV1〜FTSV7)的位置靠近硅通孔的周围。近通孔和远通硅通孔被串行连接到上部布线图案(TWP1〜TWP7)和下部布线图案(BWP1〜BWP6)。测试插座(PORT1)连接到硅通孔的上端。测试插座(PORT2)通过硅树脂通孔连接到远端。; COPYRIGHT KIPO 2013

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