Method for checking defects on crystalline body i.e. sapphire crystal, involves irradiating sapphire crystal with light, and determining path of refracted light for reconstruction of distribution of defects on sapphire crystal

摘要

The method involves irradiating a crystalline body i.e. sapphire crystal (4) with a light (L) from an LED source (14), and receiving the light reflected from the body by a camera (12), where the light reflected from the body are received from different positions for obtaining images. The distribution of defects (6) in the sapphire crystal is reconstructed from the images. The light is refracted on a complex surface (8) of the sapphire crystal, and the path of the refracted light (22) is determined for reconstruction of the distribution of defects on the sapphire crystal. An independent claim is also included for a device for checking defects on a crystalline body.