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SPECIMEN HOLDER FOR SCANNING ELECTRON MICROSCOPE, OBSERVATION SYSTEM FOR SCANNING ELECTRON MICROSCOPE IMAGE, AND OBSERVATION METHOD OF SCANNING ELECTRON MICROSCOPE IMAGE
SPECIMEN HOLDER FOR SCANNING ELECTRON MICROSCOPE, OBSERVATION SYSTEM FOR SCANNING ELECTRON MICROSCOPE IMAGE, AND OBSERVATION METHOD OF SCANNING ELECTRON MICROSCOPE IMAGE
PROBLEM TO BE SOLVED: To provide a technology capable of observing a biological specimen in an alive state with a high resolution/high contrast using a scanning electron microscope.SOLUTION: On the side of a first insulative thin film 203 provided below a conductive thin film 201, an aqueous solution 20 with an observation specimen 10 in a dissolved state or the like is held. When an electron beam incident portion is charged minus, electric dipoles of water molecules are arrayed along a potential gradient, and an electric charge is also generated on a surface of a second insulative thin film 204. This electric charge is detected by a terminal part 210 and becomes a measurement signal. In the state where an electron beam 102 is shielded, the minus potential disappears. Thus, the electric charge on a surface of the first insulative thin film also disappears and the measurement signal outputted from the terminal part 210 also becomes 0. By repeating such electron beam ON/OFF in a frequency of 1 kHz or higher, a signal of a frequency component similar thereto can be extracted from the terminal part 210.
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