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Observation of Electrostatic Latent Images and Surface Potential Measurement Using Scanning Electron Microscope

机译:用扫描电子显微镜观察静电潜像并测量表面电势

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Electrostatic voltmeters are generally used for potential measurements of electrostatic latent images. In this study, we are using SEM (Scanning Electron Microscope) for more detailed observation and potential measurement of electrostatic latent images; SEM can visualize electrostatic latent images as an image brightness distribution. We focused on clarification of the relation between surface potential of electrostatic latent image and brightness of SEM images. Electrostatic latent images were formed on PET (Polyethylene terephthalate) film by a corona discharger. We have observed SEM images of the electrostatic images after measuring surface potential of each latent image by using electrostatic voltmeters. We then measured distributions of brightness of the SEM images. We have successfully shown the relation between the surface potential and the brightness of SEM images. We hope SEM observation can be an alternative method for detail observations and measurements of electrostatic latent images.
机译:静电电压表通常用于静电潜像的电势测量。在这项研究中,我们使用SEM(扫描电子显微镜)对静电潜像进行更详细的观察和电势测量。 SEM可以将静电潜像可视化为图像亮度分布。我们着重于阐明静电潜像的表面电势与SEM图像的亮度之间的关系。通过电晕放电器在PET(聚对苯二甲酸乙二酯)薄膜上形成静电潜像。在通过使用静电电压表测量每个潜像的表面电势之后,我们已经观察到了静电图像的SEM图像。然后,我们测量了SEM图像的亮度分布。我们已经成功地显示了表面电势与SEM图像亮度之间的关系。我们希望SEM观察可以成为静电潜像的详细观察和测量的替代方法。

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