首页> 外文会议>International conference on digital printing technologies >Observation of Electrostatic Latent Images and Surface Potential Measurement Using Scanning Electron Microscope
【24h】

Observation of Electrostatic Latent Images and Surface Potential Measurement Using Scanning Electron Microscope

机译:扫描电子显微镜观察静电潜像和表面电位测量

获取原文

摘要

Electrostatic voltmeters are generally used for potential measurements of electrostatic latent images. In this study, we are using SEM (Scanning Electron Microscope) for more detailed observation and potential measurement of electrostatic latent images; SEM can visualize electrostatic latent images as an image brightness distribution. We focused on clarification of the relation between surface potential of electrostatic latent image and brightness of SEM images. Electrostatic latent images were formed on PET (Polyethylene terephthalate) film by a corona discharger. We have observed SEM images of the electrostatic images after measuring surface potential of each latent image by using electrostatic voltmeters. We then measured distributions of brightness of the SEM images. We have successfully shown the relation between the surface potential and the brightness of SEM images. We hope SEM observation can be an alternative method for detail observations and measurements of electrostatic latent images.
机译:静电电压计通常用于静电潜像的潜在测量。在这项研究中,我们使用SEM(扫描电子显微镜)进行更详细的静电潜像的观察和潜在测量; SEM可以可视化静电潜像作为图像亮度分布。我们专注于澄清静电潜像与SEM图像亮度的表面电位关系。通过电晕放电装置在PET(聚对苯二甲酸乙二醇酯)膜上形成静电潜像。我们通过使用静电电压计测量每个潜像的表面电位后观察到静电图像的SEM图像。然后我们测量了SEM图像的亮度分布。我们已经成功地显示了SEM图像的表面电位与亮度之间的关系。我们希望SEM观察可以是用于详细观察和测量静电潜像的替代方法。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号