The pin for test of semiconductor chip and the socket for test of semiconductor chip which uses that

摘要

Although this invention, the pin for test of semiconductor chip being something regarding the socket for test of semiconductor chip which includes that, in detail, the movement which is accessed the semiconductor chip being natural, contact with the test terminal becoming secure and to improve the reliability of the test, use as for the wear which is generated when contacting with the terminal of the semiconductor chip becoming small of course, when wearing of the contact terminal of one side, in the other contact terminal reversing to be able, cost to decrease and the number of parts decreasing, the semiconductor chip which can prevent the damage of the partIt is something regarding the pin for test and the socket for test of semiconductor chip which uses that. Typical figure Drawing 6