首页> 外国专利> Substrate cleaning apparatus and a substrate cleaning method and a substrate cleaning program computer-readable recording medium recording the

Substrate cleaning apparatus and a substrate cleaning method and a substrate cleaning program computer-readable recording medium recording the

机译:基板清洁装置,基板清洁方法以及记录该基板清洁方法的基板清洁程序计算机可读记录介质

摘要

PROBLEM TO BE SOLVED: To provide a substrate cleaning device, a substrate cleaning method, and a substrate cleaning program, which enable good cleaning of a substrate without damaging the surface of the substrate.;SOLUTION: A substrate cleaning device includes: liquid layer retention means (25) having a nozzle (40) for forming a liquid layer (52) of a cleaning solution; substrate heating means (24) for heating a surface of a substrate (2) to or above the boiling point of the cleaning solution; and an elevation mechanism (41a) for bringing the nozzle (40) close to the substrate (2), in which the elevation mechanism (41a) is controlled so that the liquid layer (52) formed on the nozzle (40) is heated with a surface heat of the substrate (2) heated by the substrate heating means (24) to form a vapor layer (60) between the liquid layer (52) and the surface of the substrate (2) and thereby cleaning the surface thereof.;COPYRIGHT: (C)2013,JPO&INPIT
机译:要解决的问题:提供一种基板清洁装置,一种基板清洁方法和一种基板清洁程序,它们能够在不损坏基板表面的情况下良好地清洁基板;解决方案:基板清洁装置包括:保留液层该装置(25)具有用于形成清洗液的液层(52)的喷嘴(40)。基板加热装置(24),用于将基板(2)的表面加热至清洁溶液的沸点或更高;以及使喷嘴(40)接近基板(2)的升降机构(41a),通过控制该升降机构(41a),以加热形成在喷嘴(40)上的液层(52)。由基板加热装置(24)加热的基板(2)的表面热在液体层(52)和基板(2)的表面之间形成蒸气层(60),从而清洁其表面。版权:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP5460641B2

    专利类型

  • 公开/公告日2014-04-02

    原文格式PDF

  • 申请/专利权人 東京エレクトロン株式会社;

    申请/专利号JP20110088664

  • 发明设计人 金子 聡;

    申请日2011-04-12

  • 分类号H01L21/304;

  • 国家 JP

  • 入库时间 2022-08-21 16:11:50

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