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Shock test manner null of the shock test device, and the circuit substrate of the circuit
Shock test manner null of the shock test device, and the circuit substrate of the circuit
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机译:冲击测试装置的冲击测试方式为零,电路的电路基板
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摘要
PROBLEM TO BE SOLVED: To solve problems such as an impact lack in the case of depending on manual operation or a damage accident caused by excessive impact by enabling stable tapping without depending on manual operation in an impact test for a circuit board and the like.SOLUTION: An impact test apparatus includes a control device 10 and a test device 20. An operation determination section 12 of the control device 10 determines an operation situation of the test device 20, a hammer driving section 13 controls operation of an actuator hammer 100, a setting input section 14 inputs an impact strength or automatic/manual setting, and a display section 16 displays inputted data or a determination result of operation. The test device 20 includes the actuator hammer 100 which generates an actual impact power or the like, a connecting cable 101 which connects the hammer with the control device 10, function test software 23 which monitors operation of the test device 20, and a USB cable 21 which connects the function test software 23 and the control device 10. A USB connection section 11 connects the control device 10 and the test device 20.
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