首页> 外国专利> SEMICONDUCTOR STRUCTURES, DEVICES AND ENGINEERED SUBSTRATES INCLUDING LAYERS OF SEMICONDUCTOR MATERIAL HAVING REDUCED LATTICE STRAIN

SEMICONDUCTOR STRUCTURES, DEVICES AND ENGINEERED SUBSTRATES INCLUDING LAYERS OF SEMICONDUCTOR MATERIAL HAVING REDUCED LATTICE STRAIN

机译:具有减少晶格应变的半导体材料层的半导体结构,器件和工程化基体

摘要

Methods of fabricating semiconductor devices or structures include forming structures of a semiconductor material overlying a layer of a compliant material, subsequently changing the viscosity of the compliant material to relax the semiconductor material structures, and utilizing the relaxed semiconductor material structures as a seed layer in forming a continuous layer of relaxed semiconductor material. In some embodiments, the layer of semiconductor material may comprise a III-V type semiconductor material, such as, for example, indium gallium nitride. Novel intermediate structures are formed during such methods. Engineered substrates include a continuous layer of semiconductor material having a relaxed lattice structure.
机译:制造半导体器件或结构的方法包括形成覆盖顺应材料层的半导体材料结构,随后改变顺应材料的粘度以松弛半导体材料结构,以及在形成时利用松弛的半导体材料结构作为种子层。连续的松弛半导体材料层。在一些实施例中,半导体材料层可以包括III-V型半导体材料,例如氮化铟镓。在这种方法中形成了新颖的中间结构。工程衬底包括具有松弛晶格结构的半导体材料的连续层。

著录项

  • 公开/公告号US2014312463A1

    专利类型

  • 公开/公告日2014-10-23

    原文格式PDF

  • 申请/专利权人 SOITEC;

    申请/专利号US201414319029

  • 发明设计人 CHANTAL ARENA;

    申请日2014-06-30

  • 分类号H01L21/02;H01L29/06;H01L29/20;

  • 国家 US

  • 入库时间 2022-08-21 16:09:29

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号