Method and system for imaging device characterization including look-up table construction via tensor decomposition

摘要

A method and apparatus for characterizing the performance of a printing device comprising printing a target set of patches with the device and measuring the printing device response with the printed target set; compiling a LUT from the printed target set and measured response; and representing the LUT as a tensor. According to one exemplary embodiment, tensor decomposition/parallel factor analysis is employed for compacting the tensor representation of the LUT.