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Methods of forming bonded semiconductor structures including interconnect layers having one or more of electrical, optical, and fluidic interconnects therein, and bonded semiconductor structures formed using such methods

机译:形成包括在其中具有电,光和流体互连中的一个或多个的互连层的键合半导体结构的方法,以及使用这种方法形成的键合半导体结构

摘要

Methods of forming bonded semiconductor structures include providing a substrate structure including a relatively thinner layer of material on a thicker substrate body, and forming a plurality of through wafer interconnects through the layer of material. A first semiconductor structure may be bonded over the thin layer of material, and at least one conductive feature of the first semiconductor structure may be electrically coupled with at least one of the through wafer interconnects. A transferred layer of material may be provided over the first semiconductor structure on a side thereof opposite the first substrate structure, and at least one of an electrical interconnect, an optical interconnect, and a fluidic interconnect may be formed in the transferred layer of material. A second semiconductor structure may be provided over the transferred layer of material on a side thereof opposite the first semiconductor structure. Bonded semiconductor structures are fabricated using such methods.
机译:形成键合半导体结构的方法包括:在较厚的衬底主体上提供包括相对较薄的材料层的衬底结构;以及穿过该材料层形成多个贯穿晶片互连。第一半导体结构可以结合在材料的薄层上,并且第一半导体结构的至少一个导电特征可以与晶片直通互连中的至少一个电耦合。可以在第一半导体结构的与第一衬底结构相对的一侧上在第一半导体结构上方提供材料的转移层,并且可以在材料的转移的层中形成电互连,光学互连和流体互连中的至少一个。可以在材料的转移层上与第一半导体结构相反的一侧上提供第二半导体结构。使用这种方法来制造键合的半导体结构。

著录项

  • 公开/公告号US8728863B2

    专利类型

  • 公开/公告日2014-05-20

    原文格式PDF

  • 申请/专利权人 BICH-YEN NGUYEN;MARIAM SADAKA;

    申请/专利号US201113206242

  • 发明设计人 MARIAM SADAKA;BICH-YEN NGUYEN;

    申请日2011-08-09

  • 分类号H01L21/50;H01L21/48;H01L21/44;H01L23/52;H01L23/48;H01L23/538;

  • 国家 US

  • 入库时间 2022-08-21 16:04:13

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