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SIMULATION METHOD, SIMULATION PROGRAM, SIMULATOR PROCESSING EQUIPMENT, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
SIMULATION METHOD, SIMULATION PROGRAM, SIMULATOR PROCESSING EQUIPMENT, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
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机译:仿真方法,仿真程序,仿真器处理设备以及制造半导体装置的方法
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摘要
A simulation method to cause an information processing device to calculate, including: reversely tracing a first flux incident on any position on a surface of a workpiece subject to processing treatment from the position; when the first flux strikes another position on the workpiece surface as a result of the reverse tracing of the first flux, calculating a second flux to be the first flux by scattering at the another position and reversely tracing the second flux from the another position; and, by repeating calculation and reverse tracing of flux, when the reversely traced flux no longer strikes the workpiece surface, carrying out comparison of the flux with an angular distribution of a flux incident on the workpiece, and when the current flux is within the angular distribution, obtaining an amount of flux having contributed to the scattering for a flux group from the first flux to the current flux.
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