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Method for achieving an efficient statistical optimization of integrated circuits

机译:实现集成电路的有效统计优化的方法

摘要

Method for performing timing closure of integrated circuits in the presence of manufacturing and environmental variations. The starting design is analyzed using statistical static timing analysis to determine timing violations. Each timing violation in its statistical canonical form is examined. In a first aspect of the invention, the canonical failing slack is inspected to determine what type of move is most likely to fix the timing violation taking into account all relevant manufacturing and environmental variations. In a second aspect of the invention, pre-characterized moves such as insertion of delay pad cells are evaluated for their ability to fix the timing violation without triggering timing, and the best move or set of moves is selected.
机译:在存在制造和环境变化的情况下执行集成电路时序收敛的方法。使用统计静态时序分析来分析初始设计,以确定时序违规。检查其统计规范形式的每个时序违规。在本发明的第一方面中,考虑到所有相关的制造和环境变化,检查典型的故障松弛以确定哪种类型的移动最有可能解决定时违规。在本发明的第二方面,评估诸如延迟垫单元的插入的预先表征的动作,其在不触发时序的情况下固定时序冲突的能力,并且选择最佳动作或动作组。

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