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III-N material grown on AIO/AIN buffer on Si substrate

机译:在Si基板上的AIO / AIN缓冲器上生长的III-N材料

摘要

III-N material grown on a silicon substrate includes a single crystal buffer positioned on a silicon substrate. The buffer is substantially crystal lattice matched to the surface of the silicon substrate and includes aluminum oxynitride adjacent the substrate and aluminum nitride adjacent the upper surface. A first layer of III-N material is positioned on the upper surface of the buffer. An inter-layer of aluminum nitride (AlN) is positioned on the first III-N layer and an additional layer of III-N material is positioned on the inter-layer. The inter-layer of aluminum nitride and the additional layer of III-N material are repeated n-times to reduce or engineer strain in a final III-N layer.
机译:在硅衬底上生长的III-N材料包括位于硅衬底上的单晶缓冲剂。缓冲剂基本上是晶格匹配于硅衬底的表面,并且包括与衬底相邻的氧氮化铝和与上表面相邻的氮化铝。第一层III-N材料位于缓冲器的上表面上。氮化铝(AlN)的中间层位于第一III-N层上,另外的III-N材料层位于中间层上。将氮化铝的中间层和附加的III-N材料层重复n次,以减少或设计最终的III-N层中的应变。

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