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Amorphous-silicon thin film transistor and shift register having the same

机译:非晶硅薄膜晶体管及具有该薄膜晶体管的移位寄存器

摘要

An amorphous-silicon thin film transistor and a shift resister shift resister having the amorphous-silicon TFT include a first conductive region, a second conductive region and a third conductive region. The first conductive region is formed on a first plane spaced apart from a substrate by a first distance. The second conductive region is formed on a second plane spaced apart from the substrate by a second distance. The second conductive region includes a body conductive region and two hand conductive regions elongated from both ends of the body conductive region to form an U-shape. The third conductive region is formed on the second plane. The third conductive region includes an elongated portion. The elongated portion is disposed between the two hand conductive regions of the second conductive region. The amorphous-silicon TFT and the shift resister having the amorphous TFT reduce a parasitic capacitance between the gate electrode and drain electrode.
机译:非晶硅薄膜晶体管和具有该非晶硅TFT的移位电阻移位电阻器包括第一导电区域,第二导电区域和第三导电区域。第一导电区域形成在与基板间隔开第一距离的第一平面上。第二导电区域形成在与基板间隔开第二距离的第二平面上。第二导电区域包括主体导电区域和从主体导电区域的两端延伸以形成U形的两个手部导电区域。第三导电区域形成在第二平面上。第三导电区域包括细长部分。细长部分设置在第二导电区域的两个手导电区域之间。非晶硅TFT和具有非晶TFT的移位电阻器减小了栅电极和漏电极之间的寄生电容。

著录项

  • 公开/公告号US8610179B2

    专利类型

  • 公开/公告日2013-12-17

    原文格式PDF

  • 申请/专利权人 SEUNG-HWAN MOON;BACK-WON LEE;

    申请/专利号US201113193481

  • 发明设计人 BACK-WON LEE;SEUNG-HWAN MOON;

    申请日2011-07-28

  • 分类号H01L27/148;

  • 国家 US

  • 入库时间 2022-08-21 16:00:33

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