首页> 外国专利> HIGH PURITY ERBIUM SPUTTERING TARGET COMPRISING HIGH PURITY ERBIUM METAL GATE FILM HAVING HIGH PURITY ERBIUM AS MAIN COMPONENT THEREOF AND PRODUCTION METHOD FOR HIGH PURITY ERBIUM

HIGH PURITY ERBIUM SPUTTERING TARGET COMPRISING HIGH PURITY ERBIUM METAL GATE FILM HAVING HIGH PURITY ERBIUM AS MAIN COMPONENT THEREOF AND PRODUCTION METHOD FOR HIGH PURITY ERBIUM

机译:包含以高纯度AIN为主要成分的高纯度E金属栅膜的高纯度E溅射靶及高纯度METHOD的制造方法

摘要

High purity erbium having: a purity of at least 5N excluding rare earth elements and gas components; no more than 1 wt ppm each of Al Fe Cu and Ta; no more than 10 wt ppm of W; no more than 150 wt ppm of carbon; no more than 1 wt ppm each of alkali metals and alkali rare earth metals; no more than 10 wt ppm in total of other transition metal elements; and no more than 10 wt ppb each of the radioactive elements U and Th. The present invention addresses the problem of providing: a method for increasing the purity of erbium which has a high vapor pressure and is difficult to purify in a molten state; high purity erbium obtained by said method; and technology capable of efficiently and stably providing a sputtering target comprising high purity material erbium and a metal gate thin film having the high purity erbium as the main component.
机译:高纯度,其纯度至少为5N(不包括稀土元素和气体成分); Al Fe Cu和Ta各自不超过1 wt ppm;不超过10 wt ppm的W;碳含量不超过150 wt ppm;碱金属和碱稀土金属各不超过1 wt ppm;其他过渡金属元素的总量不超过10 wt ppm;放射性元素U和Th各自不超过10 wt ppb。本发明解决了提供以下问题:提供一种提高vapor的纯度的方法,所述which的蒸气压高并且难以在熔融状态下纯化。通过所述方法获得的高纯度;能够有效且稳定地提供以高纯度材料和以高纯度为主要成分的金属栅薄膜的溅射靶的技术。

著录项

  • 公开/公告号IN2013MN02269A

    专利类型

  • 公开/公告日2014-10-10

    原文格式PDF

  • 申请/专利权人

    申请/专利号IN2269/MUMNP/2013

  • 发明设计人 TAKAHATA MASAHIRO;

    申请日2013-12-04

  • 分类号C22B9/02;C22C28/00;C22B59/00;

  • 国家 IN

  • 入库时间 2022-08-21 15:57:21

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