首页> 外国专利> HIGH-PURITY ERBIUM, SPUTTERING TARGET COMPRISING HIGH-PURITY ERBIUM, METAL GATE FILM HAVING HIGH-PURITY ERBIUM AS MAIN COMPONENT THEREOF, AND PRODUCTION METHOD FOR HIGH-PURITY ERBIUM

HIGH-PURITY ERBIUM, SPUTTERING TARGET COMPRISING HIGH-PURITY ERBIUM, METAL GATE FILM HAVING HIGH-PURITY ERBIUM AS MAIN COMPONENT THEREOF, AND PRODUCTION METHOD FOR HIGH-PURITY ERBIUM

机译:高纯度E,包含高纯度E的溅射靶材,以高纯度E为主要成分的金属栅膜及其制造方法

摘要

High-purity erbium having a purity of 5N or higher excluding rare earth elements and gas components, and containing Al, Fe, Cu, and Ta each in an amount of 1 wtppm or less, W in an amount of 10 wtppm or less, carbon in an amount of 150 wtppm or less, alkali metals and alkali earth metals each in an amount of 1 wtppm or less, other transition metal elements in a total amount of 10 wtppm or less, and U and Th as radioactive elements each in an amount of 10 wtppb or less. An object of this invention is to provide a method of highly purifying erbium, which has a high vapor pressure and is difficult to refine in a molten state, as well as technology for efficiently and stably providing high-purity erbium obtained with the foregoing method, a sputtering target made of high-purity erbium, and a metal gate film having high-purity erbium as a main component thereof.
机译:除稀土元素和气体成分外,纯度为5N或更高的高纯度,其中的Al,Fe,Cu和Ta含量分别为1 wtppm或更少,W含量为10 wtppm或更少,碳在150wtppm以下的量,碱金属和碱土金属各自在1wtppm以下的量,其他过渡金属元素在总量10wtppm以下的量以及作为放射性元素的U和Th的量10 wtppb或更少。本发明的目的是提供一种高纯度的vapor的方法,该method具有高的蒸气压并且难以在熔融状态下进行提纯,以及提供一种有效且稳定地提供通过上述方法获得的高纯度的技术,由高纯度制成的溅射靶和以高纯度为主要成分的金属栅膜。

著录项

  • 公开/公告号EP2728023A4

    专利类型

  • 公开/公告日2015-04-15

    原文格式PDF

  • 申请/专利权人 JX NIPPON MINING & METALS CORPORATION;

    申请/专利号EP20110868798

  • 发明设计人 TAKAHATA MASAHIRO;

    申请日2011-09-15

  • 分类号C22B59;C22B9/02;C22C28;C23C14/34;C25C3/34;

  • 国家 EP

  • 入库时间 2022-08-21 15:05:58

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