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SEMICONDUCTOR DEVICE AND METHOD OF BONDING DIFFERENT SIZESEMICONDUCTOR DIE AT THE WAFER LEVEL

机译:晶圆级键合不同尺寸半导体芯片的半导体器件和方法

摘要

A semiconductor wafer has first and second opposing surfaces. A plurality of conductive vias is formed partially through the first surface of the semiconductor wafer. The semiconductor wafer is singulated into a plurality of first semiconductor die. The first semiconductor die are mounted to a carrier. A second semiconductor die is mounted to the first semiconductor die. A footprint of the second semiconductor die is larger than a footprint of the first semiconductor die. An encapsulant is deposited over the first and second semiconductor die and carrier. The carrier is removed. A portion of the second surface is removed to expose the conductive vias. An interconnect structure is formed over a surface of the first semiconductor die opposite the second semiconductor die. Alternatively, a first encapsulant is deposited over the first semiconductor die and carrier, and a second encapsulant is deposited over the second semiconductor die.
机译:半导体晶片具有第一和第二相对表面。多个导电通孔部分地穿过半导体晶片的第一表面形成。半导体晶片被分割成多个第一半导体管芯。第一半导体管芯被安装到载体。第二半导体管芯被安装到第一半导体管芯。第二半导体管芯的覆盖区大于第一半导体管芯的覆盖区。密封剂沉积在第一和第二半导体管芯和载体上方。载体被移除。去除第二表面的一部分以暴露导电通孔。互连结构形成在第一半导体管芯的与第二半导体管芯相对的表面上。备选地,第一密封剂沉积在第一半导体管芯和载体上方,并且第二密封剂沉积在第二半导体管芯上方。

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