首页> 外国专利> INSTRUMENTATION CIRCUIT FOR SHUNT-BASED METROLOGY MEASUREMENT

INSTRUMENTATION CIRCUIT FOR SHUNT-BASED METROLOGY MEASUREMENT

机译:基于休顿的计量学测量的仪器电路

摘要

The present subject matter is directed to methods and apparatus for measuring current flow from a source at a first frequency using matched voltage drops in paired voltage drop circuits. The paired voltage drop circuits each comprise a fixed value component, such as a resistor, and an adjustable value component, such as an adjustable current source, coupled in series. The adjustable valued components are controlled based on differences in voltage drops produced by the voltage drop circuits based on a high-frequency signal, higher in frequency than the first frequency, applied to a control input for the adjustable value components.
机译:本主题涉及用于在成对的电压降电路中使用匹配的电压降来测量以第一频率从电源流过的电流的方法和装置。所述成对的电压降电路各自包括串联耦合的固定值组件(例如电阻器)和可调值组件(例如可调电流源)。基于所述电压降电路基于施加到所述可调值分量的控制输入的,频率高于所述第一频率的高频信号而产生的电压降的差,来控制所述可调值分量。

著录项

  • 公开/公告号SG11201401548VA

    专利类型

  • 公开/公告日2014-05-29

    原文格式PDF

  • 申请/专利权人 ITRON INC.;

    申请/专利号SG11201401548V

  • 申请日2011-12-01

  • 分类号G01R1/20;

  • 国家 SG

  • 入库时间 2022-08-21 15:55:47

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号