X-ray diffraction method of determining an effective atomic number and a relative molecular interference function

摘要

A system (10) for characterizing an unknown substance is provided. The system includes an X-ray source (64, 66, 68) configured to generate X-rays (67), a detector (16, 17, 18) configured to output a plurality of electrical signals (196, 198, 200, 202, 204, 206, 208, 210, 212) by detecting the X-rays, and a processor (190) configured to determine (940), based on the electrical signals, an effective atomic number of the unknown substance as a first function of a first gradient of a first line (956,958).