首页> 外国专利> A METHOD TO DETERMINE THE THREE-DIMENSIONAL ATOMIC STRUCTURE OF MOLECULES HAVING AN UNKNOWN STRUCTURE BY X-RAY DIFFRACTION AT A TWO DIMENSIONAL ARRAY OF THE MOLECULES ON THE SURFACE OF KNOWN MOLECULAR CRYSTAL

A METHOD TO DETERMINE THE THREE-DIMENSIONAL ATOMIC STRUCTURE OF MOLECULES HAVING AN UNKNOWN STRUCTURE BY X-RAY DIFFRACTION AT A TWO DIMENSIONAL ARRAY OF THE MOLECULES ON THE SURFACE OF KNOWN MOLECULAR CRYSTAL

机译:在二维液晶表面上二维分子阵列中通过X射线衍射确定具有未知结构的分子的三维结构的方法

摘要

The invention presents an x-ray method for determining the three-dimensional molecular structure of molecules having an unknown structure. The molecules having unknown structure are arranged in a two-dimensional periodic array on a substrate molecular crystal having a known structure. It is a requirement of the method that the dimensions of the molecules with the unknown structure are smaller than the corresponding dimensions of the substrate crystal unit cell.
机译:本发明提出一种用于确定具有未知结构的分子的三维分子结构的X射线方法。具有未知结构的分子以二维周期性阵列排列在具有已知结构的基板分子晶体上。该方法要求具有未知结构的分子的尺寸小于衬底晶体晶胞的相应尺寸。

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