首页> 外国专利> METHOD FOR PRODUCING SEMICONDUCTOR WAFERS COMPOSED OF SILICON HAVING A DIAMETER OF AT LEAST 450 MM, AND SEMICONDUCTOR WAFER COMPOSED OF SILICON HAVING A DIAMETER OF 450 MM

METHOD FOR PRODUCING SEMICONDUCTOR WAFERS COMPOSED OF SILICON HAVING A DIAMETER OF AT LEAST 450 MM, AND SEMICONDUCTOR WAFER COMPOSED OF SILICON HAVING A DIAMETER OF 450 MM

机译:直径至少为450毫米的硅制成的半导体晶片的方法,直径为450毫米的硅制成的半导体晶片的方法

摘要

the present invention is a silicon wafer consisting of a semiconductor formed by a method according to the present method to increase the diameter of the conical region having (conical section) and, at least 450 mm in diameter and at least 800 mm in length having a cylindrical region adjacent (adjoining cylindrical section) having a single crystal in a crucible containing a melt from a given impression which would raise the rate-conical at least 1.8 times greater than the average pulling speed of the pulling speed of raising a transition area from the cylindrical area for raising the cylindrical area Higher - and growing at least 20 kW cooling power of a single crystal as by cooling to, to supply heat to the single crystals are grown from the side walls of the crucible - the gap has a height of at least 70 mm, enclosing the single crystal being grown is present between the surface of the heat shield and the melt-and , to a semiconductor wafer sliced from a cylindrical region, a plurality of semiconductor wafer having a region with a v- defect that extends to the edge portion of the semiconductor wafer from the center of the semiconductor wafer - comprises The present method also relates to a silicon semiconductor wafer configured, the semiconductor wafer has a diameter of 450 mm, has an area having a defect v- that extends to the edge portion of the semiconductor wafer from the center of the semiconductor wafer. ;
机译:本发明是由半导体构成的硅晶片,该半导体通过根据本方法的方法形成,以增大具有(圆锥截面)的圆锥区域的直径,该圆锥区域的直径至少为450mm,长度至少为800mm,具有邻近的圆柱区域(相邻的圆柱部分)在坩埚中具有单晶,其中包含来自给定压痕的熔体,该圆锥区域将使圆锥形速率升高,该速率至少是从过渡区中提起过渡区域的提拉速度的平均提拉速度的1.8倍。圆柱区域,以提高圆柱区域的面积-从坩埚的侧壁生长,并通过冷却至增加至少20 kW的单晶冷却功率,以向单晶提供热量-间隙的高度为在隔热屏的表面和熔体之间至少有70 mm的厚度包围着正在生长的单晶,从圆柱形区域切下的半导体晶片上有多个一种具有v缺陷的区域的半导体晶片,该区域从半导体晶片的中心延伸到半导体晶片的边缘部分。本发明还涉及一种硅半导体晶片,该硅半导体晶片的直径为450mm的区域具有从半导体晶片的中心延伸至半导体晶片的边缘部分的缺陷v-。 ;

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