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Method of characterization of the impact of an electronic component is subjected to irradiation conditions
Method of characterization of the impact of an electronic component is subjected to irradiation conditions
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机译:电子元件撞击的表征方法要经受辐照条件
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摘要
A method of selecting a piece of electronic equipment subjected to irradiation conditions comprising at least one electronic component by characterizing a sensitivity parameter of the electronic component to the irradiation conditions listed in a predetermined specifications. The electronic component is irradiated with a source of ionizing radiation having the known irradiation characteristics and geometry. A set of operating values of the electronic component are measured during the irradiation of the electronic component. The sensitivity of the electronic component are measured for a number of irradiation conditions lower than all of the conditions listed in the specifications. The measured results are extrapolated to the other irradiation conditions of the specifications.
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