Analysis device of the defects in appearance of a transparent substrate

摘要

The invention relates to a device (1) for analysing one or more at least partially transparent substrates (2) moving relative to the device (1), including: a lighting system (4, 6) capable of simultaneously producing different types of lighting in separate lighting areas through which each substrate (2) is to move; a matrix camera (12) capable of acquiring an image, transmitted and/or reflected by the substrate(s) (2), of multiple rows of pixels and capable of acquiring simultaneously an image of multiple groups of adjacent rows of pixels that correspond to the aforementioned separate areas respectively; and a control unit (14) comprising a memory (15) in which control programs are stored that can control the camera (12) for various acquisitions synchronised with the speed of travel of the substrate(s) (2).