首页> 外国专利> Semiconductor device and method of forming interconnect structure over seed layer on contact pad of semiconductor die without undercutting seed layer beneath interconnect structure

Semiconductor device and method of forming interconnect structure over seed layer on contact pad of semiconductor die without undercutting seed layer beneath interconnect structure

机译:半导体器件和在半导体管芯的接触垫上的籽晶层上方形成互连结构而不在互连结构下方对籽晶层进行底切的方法

摘要

A semiconductor device has a semiconductor die with a first conductive layer formed over the die. A first insulating layer is formed over the die with a first opening in the first insulating layer disposed over the first conductive layer. A second conductive layer is formed over the first insulating layer and into the first opening over the first conductive layer. An interconnect structure is constructed by forming a second insulating layer over the first insulating layer with a second opening having a width less than the first opening and depositing a conductive material into the second opening. The interconnect structure can be a conductive pillar or conductive pad. The interconnect structure has a width less than a width of the first opening. The second conductive layer over the first insulating layer outside the first opening is removed while leaving the second conductive layer under the interconnect structure.
机译:半导体器件具有半导体管芯,该半导体管芯具有在管芯上方形成的第一导电层。在管芯上方形成第一绝缘层,在第一绝缘层中的第一开口设置在第一导电层上方。在第一绝缘层上方并在第一导电层上方的第一开口中形成第二导电层。通过在第一绝缘层上形成具有第二开口的第二绝缘层来构造互连结构,第二开口的宽度小于第一开口的宽度,并将导电材料沉积到第二开口中。互连结构可以是导电柱或导电垫。互连结构的宽度小于第一开口的宽度。去除第一开口外部的第一绝缘层上方的第二导电层,同时将第二导电层保留在互连结构下方。

著录项

  • 公开/公告号US9105532B2

    专利类型

  • 公开/公告日2015-08-11

    原文格式PDF

  • 申请/专利权人 STATS CHIPPAC LTD.;

    申请/专利号US201414503698

  • 发明设计人 WON KYOUNG CHOI;PANDI C. MARIMUTHU;

    申请日2014-10-01

  • 分类号H01L23/485;H01L23;H01L23/31;

  • 国家 US

  • 入库时间 2022-08-21 15:23:01

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