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Method for producing semi-insulating resistivity in high purity silicon carbide crystals

机译:在高纯度碳化硅晶体中产生半绝缘电阻率的方法

摘要

A method is disclosed for producing high quality semi-insulating silicon carbide crystals in the absence of relevant amounts of deep level trapping elements. The invention includes the steps of heating a silicon carbide crystal having a first concentration of point defects to a temperature that thermodynamically increases the number of point defects and resulting states in the crystal, and then cooling the heated crystal at a sufficiently rapid rate to maintain an increased concentration of point defects in the cooled crystal.
机译:公开了一种在不存在相关量的深能级俘获元素的情况下生产高质量的半绝缘碳化硅晶体的方法。本发明包括以下步骤:将具有第一浓度的点缺陷的碳化硅晶体加热到热力学上增加点缺陷的数量和晶体中所产生的状态的温度,然后以足够快的速率冷却加热的晶体以保持晶体的温度。冷却后晶体中点缺陷的浓度增加。

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