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MEMS-CMOS INTEGRATED DEVICES, AND METHODS OF INTEGRATION AT WAFER LEVEL

机译:MEMS-CMOS集成器件以及晶圆级集成方法

摘要

A method for forming an integrated semiconductor device includes providing a first wafer, providing a second wafer, and bonding the first wafer over the second wafer. The first wafer includes a first substrate having a microelectromechanical system (MEMS) device layer. The second wafer includes a second substrate having at least one active device, and at least one interconnect layer over the second substrate. The MEMS device layer is connected with the at least one interconnect layer. The method further includes forming at least one conductive plug through the first substrate and the MEMS device layer and inside the at least one interconnect layer, etching the second substrate and the at least one interconnect layer to form a cavity extending from a surface of the second substrate to the MEMS device layer, and etching the first substrate and the MEMS device layer to form a MEMS device interfacing with the cavity.
机译:一种用于形成集成半导体器件的方法,包括:提供第一晶片;提供第二晶片;以及在第二晶片上方键合第一晶片。第一晶片包括具有微机电系统(MEMS)器件层的第一衬底。第二晶片包括具有至少一个有源器件的第二衬底以及在第二衬底上方的至少一个互连层。 MEMS器件层与至少一个互连层连接。该方法还包括:形成穿过第一基板和MEMS器件层并且在至少一个互连层内部的至少一个导电插塞;蚀刻第二基板和至少一个互连层以形成从第二基板的表面延伸的腔。衬底至MEMS器件层,并蚀刻第一衬底和MEMS器件层以形成与腔接口的MEMS器件。

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