首页> 外国专利> High ion and low sub-threshold swing tunneling transistor

High ion and low sub-threshold swing tunneling transistor

机译:高离子低亚阈值摆幅隧穿晶体管

摘要

Devices and manufacturing methods thereof are presented. The device includes a substrate and a fin-type transistor disposed on the substrate. The transistor includes a fin structure that protrudes from the substrate to serve as a source of the transistor. The fin structure is doped with dopants of a first polarity. The transistor also includes a gate layer formed over and around a first end of the fin structure to serve as a gate of the transistor. A drain layer is disposed over the fin structure and adjacent to the gate layer to serve as a drain of the transistor. The drain layer is doped with dopants of a second polarity opposite the first polarity.
机译:提出了器件及其制造方法。该装置包括基板和设置在该基板上的鳍型晶体管。该晶体管包括从基板突出以用作晶体管的源极的鳍结构。鳍结构掺杂有第一极性的掺杂剂。晶体管还包括形成在鳍结构的第一端上方和周围的栅极层,以用作晶体管的栅极。漏极层设置在鳍结构上方并与栅极层相邻,以用作晶体管的漏极。漏极层掺杂有与第一极性相反的第二极性的掺杂剂。

著录项

  • 公开/公告号US9054191B2

    专利类型

  • 公开/公告日2015-06-09

    原文格式PDF

  • 申请/专利权人 GLOBALFOUNDRIES SINGAPORE PTE. LTD.;

    申请/专利号US201314055893

  • 发明设计人 ENG HUAT TOH;SHYUE SENG TAN;

    申请日2013-10-17

  • 分类号H01L29/06;H01L21/8238;H01L29/78;H01L29/66;H01L29/40;H01L21/8234;

  • 国家 US

  • 入库时间 2022-08-21 15:17:15

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号