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Ohmic contact schemes for group III-V devices having a two-dimensional electron gas layer

机译:具有二维电子气层的III-V组器件的欧姆接触方案

摘要

A semiconductor device includes a first layer and a second layer over the first layer. The first and second layers are configured to form an electron gas layer at an interface of the first and second layers. The semiconductor device also includes an Ohmic contact and multiple conductive vias through the second layer. The conductive vias are configured to electrically couple the Ohmic contact to the electron gas layer. The conductive vias could have substantially vertical sidewalls or substantially sloped sidewalls, or the conductive vias could form a nano-textured surface on the Ohmic contact. The first layer could include Group III-nitride nucleation, buffer, and channel layers, and the second layer could include a Group III-nitride barrier layer.
机译:半导体器件包括第一层和在第一层之上的第二层。第一和第二层被配置为在第一和第二层的界面处形成电子气层。该半导体器件还包括欧姆接触和穿过第二层的多个导电通孔。导电通孔被配置为将欧姆接触电耦合至电子气层。导电通孔可以具有基本垂直的侧壁或基本倾斜的侧壁,或者导电通孔可以在欧姆接触上形成纳米纹理化的表面。第一层可以包括III族氮化物成核层,缓冲层和沟道层,第二层可以包括III族氮化物阻挡层。

著录项

  • 公开/公告号US8946780B2

    专利类型

  • 公开/公告日2015-02-03

    原文格式PDF

  • 申请/专利权人 SANDEEP R. BAHL;RICHARD W. FOOTE JR.;

    申请/专利号US201113037974

  • 发明设计人 SANDEEP R. BAHL;RICHARD W. FOOTE JR.;

    申请日2011-03-01

  • 分类号H01L21/285;H01L21/02;H01L29/45;H01L29/778;H01L29/417;H01L29/66;H01L29/20;

  • 国家 US

  • 入库时间 2022-08-21 15:17:11

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