The present invention relates to a method for determining a residual stress gradient in a sample using X-ray diffraction, wherein the sample is supported on a sample holder defining a sample plane, the method comprising the steps of- irradiating a beam from an X-ray source onto the sample and detecting a beam diffracted by the sample with an X-ray detector having two degrees of freedom, wherein the directions of the incident beam and/or the diffracted beam are varied in relation to the sample and the position of the X-ray detector is varied in two degrees of freedom, and- determining the values sin2Ψ and τµ, which are representative for the residual stress gradient in the sample, as a function of the X-ray source and x-ray detector positions taking into account the two degrees of freedom of the detector, wherein Ψ is the polar angle, τ is the penetration depth of the beam into the sample, and µ is the mass attenuation coefficient of the sample.;In order to improve this method, it is suggested that the variation of the directions of the incident beam and/or the diffracted beam comprises a rotation of the diffracted beam by an angle 2θχ within a plane that is inclined against the sample plane, designated in-plane arm rotation.
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