首页> 外国专利> METHOD TO MANUFACTURE TUNGSTEN SPUTTERING TARGET FOR SEMICONDUCTOR AND TUNGSTEN SPUTTERING TARGET MANUFACTURED BY SAME

METHOD TO MANUFACTURE TUNGSTEN SPUTTERING TARGET FOR SEMICONDUCTOR AND TUNGSTEN SPUTTERING TARGET MANUFACTURED BY SAME

机译:制造半导体的钨溅射靶的方法和相同制造的钨溅射靶

摘要

The present invention provides a method to manufacture a tungsten sputtering target and a high purity and high density tungsten target, manufactured by the method. The method includes a step (a) of manufacturing a forming body by forming high purity tungsten powder; a step (b) of pressurizing the forming body through cold isostatic pressing (CIP); a step (c) of performing thermal treatment under reactive or vacuum mood; and a step (d) of manufacturing a high density pellet by sintering through hot hydrostatic pressing. According to the present invention, high density is secured through forming and CIP processes using high purity powder, and the refinement of crystal grains and high purity and high density tungsten target are secured through non-pressurizing vacuum thermal treatment and hot hydrostatic pressing.;COPYRIGHT KIPO 2015
机译:本发明提供一种制造钨溅射靶的方法以及通过该方法制造的高纯度高密度钨靶。该方法包括步骤(a):通过形成高纯度钨粉来制造成形体;以及步骤(b):通过冷等静压(CIP)对成型体加压; (c)在反应性或真空状态下进行热处理的步骤;步骤(d):通过热静压烧结而制造高密度粒料。根据本发明,通过使用高纯度粉末的成形和CIP工艺来确保高密度,并且通过非加压真空热处理和热静压来确保晶粒的细化以及高纯度和高密度钨靶。韩国知识产权局2015

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