首页> 外国专利> METHODS FOR REMOVING BLACK SILICON AND BLACK SILICON CARBIDE FROM SURFACES OF SILICON AND SILICON CARBIDE ELECTRODES FOR PLASMA PROCESSING APPARATUSES

METHODS FOR REMOVING BLACK SILICON AND BLACK SILICON CARBIDE FROM SURFACES OF SILICON AND SILICON CARBIDE ELECTRODES FOR PLASMA PROCESSING APPARATUSES

机译:从等离子体处理装置的硅和碳化硅电极表面去除黑硅和黑碳化硅的方法

摘要

Methods for removing black silicon or black silicon carbide from a plasma-exposed surface of an upper electrode of a plasma processing chamber are provided. The methods include forming a plasma using a gas composition containing a fluorine-containing gas, and removing the black silicon or black silicon carbide from the surface with the plasma. The methods can also remove black silicon or black silicon carbide from surfaces of the components in the chamber in addition to the upper electrode.
机译:提供了用于从等离子体处理室的上电极的暴露于等离子体的表面去除黑硅或黑碳化硅的方法。该方法包括使用包含含氟气体的气体组合物形成等离子体,以及用等离子体从表面去除黑硅或黑碳化硅。该方法还可以从室中除了上部电极之外的部件的表面去除黑硅或黑碳化硅。

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