首页> 外国专利> NORMALLY-OFF III-NITRIDE TRANSISTORS WITH HIGH THRESHOLD-VOLTAGE AND LOW ON-RESISTANCE

NORMALLY-OFF III-NITRIDE TRANSISTORS WITH HIGH THRESHOLD-VOLTAGE AND LOW ON-RESISTANCE

机译:具有高阈值电压和低导通电阻的常关型III氮化物晶体管

摘要

A field effect transistor (FET) includes a III-Nitride channel layer, a III-Nitride barrier layer on the channel layer, wherein the barrier layer has an energy bandgap greater than the channel layer, a source electrode electrically coupled to one of the III-Nitride layers, a drain electrode electrically coupled to one of the III-Nitride layers, a gate insulator layer stack for electrically insulating a gate electrode from the barrier layer and the channel layer, the gate insulator layer stack including an insulator layer, such as SiN, and an AlN layer, the gate electrode in a region between the source electrode and the drain electrode and in contact with the insulator layer, and wherein the AlN layer is in contact with one of the III-Nitride layers.
机译:场效应晶体管(FET)包括III氮化物沟道层,位于沟道层上的III氮化物势垒层,其中该势垒层的能带隙大于沟道层,源极电耦合至III之一-氮化物层,电耦合至III氮化物层之一的漏电极,用于使栅电极与势垒层和沟道层电绝缘的栅绝缘体层堆叠,栅绝缘体层堆叠包括诸如SiN和AlN层,栅电极在源电极和漏电极之间的区域中并且与绝缘体层接触,并且其中AlN层与III族氮化物层之一接触。

著录项

  • 公开/公告号EP3055885A1

    专利类型

  • 公开/公告日2016-08-17

    原文格式PDF

  • 申请/专利权人 HRL LABORATORIES LLC;

    申请/专利号EP20130894581

  • 申请日2013-09-30

  • 分类号H01L29/778;H01L21/335;

  • 国家 EP

  • 入库时间 2022-08-21 14:50:26

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