首页> 外国专利> ALIGNMENT OFF-SET CALCULATION METHOD OF SHAPE MEASUREMENT DEVICE AND CONTROL METHOD OF SHAPE MEASUREMENT DEVICE

ALIGNMENT OFF-SET CALCULATION METHOD OF SHAPE MEASUREMENT DEVICE AND CONTROL METHOD OF SHAPE MEASUREMENT DEVICE

机译:形状测量装置的对准偏移计算方法和形状测量装置的控制方法

摘要

PROBLEM TO BE SOLVED: To provide an alignment off-set calculation method of a shape measurement device and control method of the shape measurement device that allow a detection point of a point sensor to be easily and quickly aligned with a measurement start point.SOLUTION: Alignment means is composed of two or more laser light sources 231 and 232 disposed in an area around a point sensor 200, in which laser light LA from two or more laser light sources 231 and 232 intersects at an adjustment Pc serving as a position further separated from the point sensor 200 by a prescribed distance from the detection point Ps. The alignment means is configured to: calculate off-set with the adjustment point aligned with a photoelectric sensor; relatively move the point sensor 200 and a work W by the off-set after aligning the adjustment point Pc with a desired measurement start point Pm on the work W, and then, cause the point sensor 200 to come proximity to the work W; and start a measurement scanning of the work W.SELECTED DRAWING: Figure 5
机译:解决的问题:提供一种形状测量装置的对准偏移计算方法和形状测量装置的控制方法,以使点传感器的检测点可以轻松,快速地与测量起点对准。对准装置由布置在点传感器200周围的区域中的两个或更多个激光源231和232组成,其中来自两个或更多个激光源231和232的激光LA以用作进一步分离的位置的调节Pc相交。与点传感器200之间的距离为距检测点Ps的规定距离。对准装置被配置为:计算偏移量,其中调整点与光电传感器对准;以及在将调整点Pc与工件W上的期望的测量起始点Pm对准之后,通过偏移使点传感器200和工件W相对移动,然后使点传感器200接近工件W。并开始对工件进行测量扫描。选定的图:图5

著录项

  • 公开/公告号JP2016075476A

    专利类型

  • 公开/公告日2016-05-12

    原文格式PDF

  • 申请/专利权人 MITSUTOYO CORP;

    申请/专利号JP20140203957

  • 发明设计人 SHINDO HIDEKI;IZUMI NAOKI;HIRANO KOTARO;

    申请日2014-10-02

  • 分类号G01B11/14;G01B11/00;

  • 国家 JP

  • 入库时间 2022-08-21 14:47:45

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号