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MEASUREMENT OBJECT ALIGNMENT METHOD IN SURFACE SHAPE MEASUREMENT DEVICE AND SURFACE SHAPE MEASUREMENT DEVICE

机译:表面形状测量装置及表面形状测量装置中的测量对象对准方法

摘要

PROBLEM TO BE SOLVED: To provide a surface shape measurement device and alignment method that can simply, quickly and accurately implement an alignment (a tilt angle adjustment) of a measurement object regardless of a degree of skill of operators.SOLUTION: In a Mireau type scan type white interferometer performing a three-dimensional measurement of a surface shape of a measurement object and the like in a non-contact, an adjustment area (reference area 100, an x-axis levelling adjustment area 110 and a y-axis levelling area 120) is set up at three sites with respect to a measured face (interference image of the measured face) of the measurement object as a preparation work prior to a measurement, and positions in a z-axis direction of the adjustment areas are detected. Then, a tilt angle of a stage supporting the measurement object is adjusted so that the positions in the z-axis direction of the adjustment areas match to thereby align the positions therein so that the measured face of the measurement object is horizontal.SELECTED DRAWING: Figure 13
机译:解决的问题:提供一种表面形状测量装置和对准方法,其可以简单,快速,准确地实现测量对象的对准(倾斜角度调整),而与操作人员的技术水平无关。解决方案:米罗型扫描型白色干涉仪以非接触方式对测量对象等的表面形状进行三维测量,调整区域(基准区域100,x轴水平调整区域110和y轴水平区域)在进行测量前的准备工作时,在相对于被测量物的被测面部(被测面部的干涉图像)的三个部位设置120),并检测调整区域在z轴方向上的位置。然后,调整支撑测量对象的平台的倾斜角度,以使调整区域在z轴方向上的位置匹配,从而使其中的位置对齐,从而使测量对象的被测表面为水平。图13

著录项

  • 公开/公告号JP2016080564A

    专利类型

  • 公开/公告日2016-05-16

    原文格式PDF

  • 申请/专利权人 TOKYO SEIMITSU CO LTD;

    申请/专利号JP20140213454

  • 发明设计人 NUMAZU MASATOSHI;

    申请日2014-10-20

  • 分类号G01B11/24;G01B9/02;

  • 国家 JP

  • 入库时间 2022-08-21 14:47:34

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