首页> 外国专利> METHOD OF MATCHING MEASUREMENT CENTER POSITIONS WHEN MEASURING THICKNESS OF LIQUID WITH OPTICAL INTERFERENCE MEASUREMENT MEANS AND ULTRASONIC MEASUREMENT MEANS, AND METHOD OF MEASURING LIQUID THICKNESS USING THE SAME

METHOD OF MATCHING MEASUREMENT CENTER POSITIONS WHEN MEASURING THICKNESS OF LIQUID WITH OPTICAL INTERFERENCE MEASUREMENT MEANS AND ULTRASONIC MEASUREMENT MEANS, AND METHOD OF MEASURING LIQUID THICKNESS USING THE SAME

机译:用光学干涉测量手段和超声测量手段测量液体厚度时匹配测量中心位置的方法,以及使用相同方法测量液体厚度的方法

摘要

PROBLEM TO BE SOLVED: To provide a method of matching measurement center positions when measuring the thickness of liquid with optical interference measurement means and ultrasonic measurement means for comparing and evaluating measurement results by obtaining the more correct measurement results with the optical interference measurement means and the ultrasonic measurement means on the thickness of liquid filled in a portion of a space formed in the periphery of a contact surface between a first member and a second member, and a method of measuring the liquid thickness using the same.;SOLUTION: A method of matching measurement center positions comprises: an optical interference fringe measurement step of measuring with optical interference measurement means an optical interference fringe formed by emitting measurement light to a second member from the lower side to the upper side thereof and a first member from the upper side to the lower side thereof; a measurement center mark application step of positioning a specification part of a measurement positioning jig to the center of the optical interference fringe; an ultrasonic scanning step of scanning an ultrasonic probe so as to pass through the specification part to detect at least one of the echo intensity and reflection relevant time; and an ultrasonic measurement center setting step of setting the detected position of the specification part to the ultrasonic measurement center position.;SELECTED DRAWING: Figure 14;COPYRIGHT: (C)2016,JPO&INPIT
机译:解决的问题:提供一种在利用光学干涉测量装置和超声波测量装置测量液体厚度时匹配测量中心位置的方法,以通过光学干涉测量装置和测量装置获得更正确的测量结果来比较和评估测量结果。超声波测量装置,用于测量填充在第一部件和第二部件之间的接触表面的外围中形成的空间的一部分中的液体的厚度,以及使用该方法测量液体厚度的方法。匹配的测量中心位置包括:光学干涉条纹测量步骤,其通过光学干涉测量装置进行测量,该光学干涉条纹通过将测量光从其下侧到上侧发射到第二构件和从上侧发射到第二构件而形成。其下侧;测量中心标记施加步骤,将测量定位夹具的指定部分定位到光学干涉条纹的中心;超声波扫描步骤,其扫描超声波探头以使其穿过指定部分以检测回波强度和反射相关时间中的至少一个;超声波检测中心设定步骤,将指定部位的检测位置设定为超声波检测中心位置。选图:图14;版权:(C)2016,JPO&INPIT

著录项

  • 公开/公告号JP2016080360A

    专利类型

  • 公开/公告日2016-05-16

    原文格式PDF

  • 申请/专利权人 JTEKT CORP;

    申请/专利号JP20140208232

  • 申请日2014-10-09

  • 分类号G01B21/08;G01B21/00;G01B11/06;G01B17/02;

  • 国家 JP

  • 入库时间 2022-08-21 14:47:36

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