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SPECTRUM MEASUREMENT SYSTEM AND SPECTRAL LINE WIDTH MEASURING METHOD

机译:光谱测量系统和光谱线宽度测量方法

摘要

PROBLEM TO BE SOLVED: To provide a spectrum measurement device and a measuring method thereof that enable a spectral line width to be measured with good reproducibility without requiring particular adjustment even if fluctuations occur in a polarization plane of a laser beam when light made incident passes through a delay optical fiber in the spectrum measurement device.;SOLUTION: There is provided a spectrum measurement system for measuring a spectral line width from results of spectrum analysis of beat signals. In the spectrum measurement system, a polarization scrambler for randomizing polarization conditions of a passing-through laser beam is connected between an output side of a delay optical fiber and an input side of an optical directional coupler.;COPYRIGHT: (C)2016,JPO&INPIT
机译:解决的问题:提供一种光谱测定装置及其测定方法,即使入射的光通过时激光的偏振面发生变动,也能够不进行特别的调整而以良好的再现性进行光谱线宽的测定。解决方案:提供了一种频谱测量系统,用于根据差拍信号的频谱分析结果来测量频谱线宽。在光谱测量系统中,用于将通过激光束的偏振条件随机化的偏振加扰器连接在延迟光纤的输出侧和光定向耦合器的输入侧之间.COPYRIGHT:(C)2016,JPO&INPIT

著录项

  • 公开/公告号JP2015224952A

    专利类型

  • 公开/公告日2015-12-14

    原文格式PDF

  • 申请/专利权人 OPTOHUB:KK;

    申请/专利号JP20140109654

  • 发明设计人 OIKAWA MASAHIRO;AOKI CHIKAO;

    申请日2014-05-28

  • 分类号G01J9/04;

  • 国家 JP

  • 入库时间 2022-08-21 14:43:10

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