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Characteristic test method of a semiconductor device using a characteristic test device and apparatus for a semiconductor device
Characteristic test method of a semiconductor device using a characteristic test device and apparatus for a semiconductor device
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机译:使用特性测试装置的半导体器件的特性测试方法和用于半导体器件的设备
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摘要
PROBLEM TO BE SOLVED: To provide a characteristic test device for semiconductor elements formed by sealing a semiconductor chip with resin, capable of reducing a test cost by simultaneously performing an insulation tolerance test of a resin seal part 15 with another characteristic test and reducing an occupation area of the entire characteristic test device, and to provide a method for testing characteristics of semiconductor elements using the device.;SOLUTION: A voltage application jig 1 for testing insulation resistance is brought into contact with the resin seal part 15 of a semiconductor element, and a high voltage that is applied in a static characteristic test or a dynamic characteristic test is applied to the voltage application jig 1 to simultaneously perform an insulation resistance test of the resin seal part 15 with a characteristic test (a leak current test, a voltage endurance characteristic test, an L loading test or the like).;COPYRIGHT: (C)2013,JPO&INPIT
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