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Automatic test apparatus for functional digital testing of multiple semiconductor integrated circuit devices
Automatic test apparatus for functional digital testing of multiple semiconductor integrated circuit devices
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机译:用于多个半导体集成电路器件的功能数字测试的自动测试设备
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摘要
An automatic test apparatus for testing the digital functionality of multiple semiconductor integrated circuit devices simultaneously connected to the apparatus generates data patterns suitable for testing at least one of the devices. Stimulus test signals of the data patterns are replicated and distributed to the devices. Expected response signals of the devices for the test signals are also replicated and distributed to comparators for comparing the actual response of the devices with the expected response.
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