METHOD FOR TESTING A MEDIUM CARRYING MULTIPLE INTEGRATED CIRCUITS WITH DIGITAL OPERATION, INTEGRATED CIRCUIT SPECIFICALLY MOUNTED ON A MEDIUM TO BE TESTED AS WELL, AND MEDIUM PROVIDED WITH MULTIPLE INTEGRATED CIRCUITS OF THIS TYPE

摘要

THE DESCRIPTION CONCERNS A METHOD FOR TESTING INTEGRATED CIRCUITS MOUNTED ON A SUPPORT. THESE INTEGRATED CIRCUITS ARE PROVIDED WITH A SERIAL INPUT AND A SERIAL OUTPUT FOR TEST AND RESULT REASONS. IN ADDITION, A MODE CONTROL REGISTER IS PROVIDED FOR RECEIVING A FASHION CONTROL SIGNAL TRAIN VIA THE SERIAL INPUT. UNDER THE CONTROL OF THIS MODE CONTROL SIGNAL TRAIN, THE SERIAL INPUT AND THE SERIAL OUTPUT MAY BE SHORT-CIRCUITOUS, OR OTHER REGISTERS MAY BE SELECTIVELY FILLED OR EMPTY. THE INTERNAL PART OF THE INTEGRATED CIRCUIT AS WELL AS THE RESPECTIVE INTERCONNECTION FUNCTIONS CAN SO EASILY BE TESTED USING A UNIVERSAL PROTOCOL. THE INTEGRATED CIRCUITS AS WELL AS THE SUPPORT REQUIRE THAT LOW ADAPTATION DEVELOPMENTS.