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VALIDATION OF MONOLITHIC CIRCUIT TEST STANDARDS THROUGH AN INTEGRATED COS/MOS MULTIPLEXER

机译：通过集成的COs / mOs多路复用器验证单片电路测试标准

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Achievement of program objectives was keyed to the following developments:na. Validation of the proposed NASA test standards by applying suitable tests at appropriate steps in the COS/MOS process.nb. Design and development of a COS/MOS 16-channel multiplexer circuit.nc. Fabrication of the 16-channel COS/MOS multiplexer, using the RCA COS/MOS process.

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作者
R. Mao;
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年度 1970
页码 1-91
总页数 91
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Integrated circuits; Multiplexing; Counting circuits; Switching circuits; Systems engineering; Transistor circuits;

机译：集成电路;多路复用;计数电路;开关电路;系统工程;晶体管电路;

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2. A Design-for-Test Solution Based on Dedicated Test Layers and Test Scheduling for Monolithic 3-D Integrated Circuits [J] . Koneru Abhishek, Kannan Sukeshwar, Chakrabarty Krishnendu IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems . 2019,第10期

机译：基于专用测试层和测试计划的单片3-D集成电路测试设计解决方案
3. From model to low noise amplifier monolithic microwave integrated circuit: 0.03–2.6 GHz plastic quad-flat no-leads packaged Gallium-Nitride low noise amplifier monolithic microwave integrated circuit [J] . Osmanoglu Sinan, Ozbay Ekmel International journal of numerical modelling . 2021,第5期

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4. A fully-differential, multiplex-sensing interface circuit monolithically integrated with tri-axis pure oxide capacitive CMOS-MEMS accelerometers [C] . Liu Yu-Chia, Tsai Ming-Han, Li Sheng-Shian, International Conference on Solid-State Sensors, Actuators and Microsystems . 2013

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5. Testing methods for current-mode integrated circuits under the very low cost tester (VLCT) and LabViewRTM test platform. [D] . Couttolenc Valdes, Sergio. 2004

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6. Fabrication of Low Cost and Low Temperature Poly-Silicon Nanowire Sensor Arrays for Monolithic Three-Dimensional Integrated Circuits Applications [O] . Siqi Tang, Jiang Yan, Jing Zhang, 2020

机译：用于单片三维集成电路应用的低成本和低温多晶硅纳米线传感器阵列的制造
7. Test set-ups for fast measurement of monolithic integrated circuits from on-wafer to system. application to a novel GaAs monolithic transimpedance amplifier for high speed optical communication systems [O] . Dorta P., Salazar-Palma M., Casao J.A., 1992

机译：测试设置，用于快速测量从晶圆上到系统的单片集成电路。在新型GaAs单片互阻放大器中的应用

VALIDATION OF MONOLITHIC CIRCUIT TEST STANDARDS THROUGH AN INTEGRATED COS/MOS MULTIPLEXER

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