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ASYMMETRIC ULTRATHIN SOI MOS TRANSISTOR STRUCTURE AND METHOD OF MANUFACTURING SAME

机译:非对称超薄SOI MOS晶体管结构及其制造方法

摘要

A method for manufacturing an asymmetric super-thin SOIMOS transistor is disclosed. The method comprises: a. providing a substrate composed of an insulating layer (200) and a semiconductor layer (300); b. forming a gate stack (304) on the substrate; c. removing semiconductor materials of the semiconductor layer (300) on a source region side to form a first vacancy (001); d. removing insulating materials of the insulating layer (200) in the source region and under channel near the source region to form a second vacancy (002); e. filling semiconductor materials into the first vacancy (001) and the second vacancy (002) to connect with the semiconductor materials above the second vacancy (002); and f. performing source/drain implantation. Compared with the prior art, the method of the disclosure can suppress the short channel effects and enhance device performance.
机译:公开了一种用于制造非对称超薄SOIMOS晶体管的方法。该方法包括:a。提供由绝缘层( 200 )和半导体层( 300 )组成的基板; b。在衬底上形成栅叠层( 304 ); C。去除源区侧的半导体层( 300 )的半导体材料,以形成第一空位( 001 ); d。去除所述源极区域中以及所述源极区域附近的沟道下方的绝缘层( 200 )的绝缘材料,形成第二空位( 002 ); e。将半导体材料填充到第一个空位( 001 )和第二个空位( 002 )中,以与第二个空位( 002 );和f。执行源/漏注入。与现有技术相比,本发明的方法可以抑制短沟道效应并提高器件性能。

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