首页> 外国专利> SULFUR AND FLUORINE CONTAINING ETCH CHEMISTRY FOR IMPROVEMENT OF DISTORTION AND BOW CONTROL FOR HAR ETCH

SULFUR AND FLUORINE CONTAINING ETCH CHEMISTRY FOR IMPROVEMENT OF DISTORTION AND BOW CONTROL FOR HAR ETCH

机译:含硫和氟的蚀刻化学,以改善硬蚀刻的变形和弓形控制

摘要

In accordance with this disclosure, there is provided several inventions, including a method for etching a plurality of features in a stack comprising alternating layers above a substrate, comprising: providing a steady state flow of an etching gas, wherein the etching gas comprises: a molecule A comprising sulfur and fluorine; a molecule B comprising carbon, fluorine, and hydrogen; and a molecule C comprising carbon and fluorine and not hydrogen; forming the etching gas into a plasma; and etching the features into the stack through the plurality of alternating layers.
机译:根据本公开,提供了几种发明,包括用于蚀刻包括在衬底上方的交替层的堆叠中的多个特征的方法,该方法包括:提供蚀刻气体的稳态流,其中蚀刻气体包括:包含硫和氟的分子A;包含碳,氟和氢的分子B;分子C包括碳和氟而不是氢。使蚀刻气体形成等离子体;通过多个交替层将特征蚀刻到堆叠中。

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