首页> 外国专利> LDMOS device with step-like drift region and fabrication method thereof

LDMOS device with step-like drift region and fabrication method thereof

机译:具有阶梯状漂移区的ldmos器件及其制造方法

摘要

An LDMOS device is disclosed. The LDMOS device includes: a substrate having a first type of conductivity; a drift region having a second type of conductivity and a doped region having the first type of conductivity both formed in the substrate; a drain region having the second type of conductivity and being formed in the drift region, the drain region being located at an end of the drift region farther from the doped region; and a buried layer having the first type of conductivity and being formed in the drift region, the buried layer being in close proximity to the drain region and having a step-like bottom surface, and wherein a depth of the buried layer decreases progressively in a direction from the drain region to the doped region. A method of fabricating LDMOS device is also disclosed.
机译:公开了一种LDMOS器件。所述LDMOS器件包括:具有第一类型的导电性的基板;具有第二类型导电性的漂移区和具有第一类型导电性的掺杂区均形成在基板中;在漂移区中形成具有第二导电类型的漏极区,该漏极区位于漂移区的远离掺杂区的一端。埋入层,其具有第一类型的导电性,并形成在漂移区中,该埋入层紧邻漏极区并具有阶梯状的底表面,并且其中,埋入层的深度在垂直方向上逐渐减小。从漏极区到掺杂区的方向。还公开了一种制造LDMOS器件的方法。

著录项

  • 公开/公告号US9478640B2

    专利类型

  • 公开/公告日2016-10-25

    原文格式PDF

  • 申请/专利权人 SHANGHAI HUA HONG NEC ELECTRONICS CO. LTD;

    申请/专利号US201313970050

  • 发明设计人 WENSHENG QIAN;

    申请日2013-08-19

  • 分类号H01L29/06;H01L29/66;H01L29/78;H01L29/08;

  • 国家 US

  • 入库时间 2022-08-21 14:33:00

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号