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Writing and verifying circuit for a resistive memory and method for writing and verifying a resistive memory

机译:用于电阻存储器的写入和验证电路以及用于写入和验证电阻存储器的方法

摘要

A writing and verifying circuit and a method for writing and verifying a resistive memory thereof are provided. The steps of the method includes: enabling at least one word line signal corresponding to at least one selected resistive memory cell of the resistive memory during a writing and verifying timing period; providing a bit line voltage to the selected resistive memory cells, wherein the bit line voltage continuously increases or decreases from a first voltage level to a second voltage level during the writing and verifying timing period; and, measuring a detected current through the bit line and determining a finish time point of the writing and verifying timing period according to the detected current and a reference current.
机译:提供了一种写入和验证电路及其用于写入和验证其电阻存储器的方法。该方法的步骤包括:在写入和验证定时周期期间,使对应于电阻存储器的至少一个选择的电阻存储单元的至少一个字线信号;以及向所选择的电阻存储单元提供位线电压,其中在写入和验证时序周期期间,位线电压从第一电压电平连续地增加或减少到第二电压电平;测量通过位线的检测电流,并根据检测到的电流和参考电流确定写入和校验时序周期的结束时间点。

著录项

  • 公开/公告号US9312001B1

    专利类型

  • 公开/公告日2016-04-12

    原文格式PDF

  • 申请/专利权人 WINBOND ELECTRONICS CORP.;

    申请/专利号US201514623507

  • 发明设计人 KOYING HUANG;

    申请日2015-02-17

  • 分类号G11C11;G11C13;

  • 国家 US

  • 入库时间 2022-08-21 14:32:55

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